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Diagnostics of semiconductor structures by means of an apertureless near-field terahertz microscope.
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- Radiophysics & Quantum Electronics, 2012, v. 54, n. 8/9, p. 577, doi. 10.1007/s11141-012-9316-x
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- Article
Interaction of terahertz electromagnetic radiation with a probe-object system in a terahertz apertureless near-field microscope.
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- JETP Letters, 2011, v. 93, n. 3, p. 119, doi. 10.1134/S0021364011030179
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- Article