Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleLattice Tilt Mapping using Full Field Diffraction X-Ray Microscopy at ID01 ESRF.AuthorsZhou, Tao; Stankevic, Tomas; Troian, Andrea; Ren, Zhe; Bi, Zhaoxia; Ohlsson, Jonas; Samuelson, Lars; Hilhorst, Jan; Schulli, Tobias; Mikkelsen, Anders; Balmes, OlivierPublicationMicroscopy & Microanalysis, 2018, Vol 24, p126ISSN1431-9276Publication typeAbstractDOI10.1017/S1431927618013028