Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitlePtychographic X‐ray speckle tracking.AuthorsMorgan, Andrew J.; Quiney, Harry M.; Bajt, Saša; Chapman, Henry N.PublicationJournal of Applied Crystallography, 2020, Vol 53, Issue 3, p760ISSN0021-8898Publication typeArticleDOI10.1107/S1600576720005567