Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleLocal lattice parameter determination of a silicon (001) layer grown on a sapphire (11¯02) substrate using convergent-beam electron diffraction.AuthorsTakayuki Akaogi; Kenji Tsuda; Masami Terauchi; Michiyoshi TanakaPublicationJournal of Electron Microscopy, 2006, Vol 55, Issue 3, p129ISSN0022-0744Publication typeArticleDOI10.1093/jmicro/dfl020