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- Title
Multiskalige Oberflächeninspektion mit Wavelets und Deflektometrie.
- Authors
Greiner, Thomas; Le, Tan-Toan; Ziebarth, Mathias; Heizmann, Michael
- Abstract
For the inspection of specular surfaces, deflectometry is one of the most popular methods. However, there is still nomethod for automated detection of defects, classification and evaluation of the data fromdeflectometric measurements. In this paper new methods based on wavelet analysis are introduced, which are able to detect defects at different scales. For better recognition rates the filter banks are optimized on given defect classes as well as on dominant feature sizes. The methods are evaluated with real data of various defect classes.
- Publication
Technisches Messen, 2016, Vol 83, Issue 11, p617
- ISSN
0171-8096
- Publication type
Article
- DOI
10.1515/teme-2015-0047