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- Title
Persistent current relaxation in polycrystalline superconducting thin films.
- Authors
Belevtsov, L. V.
- Abstract
The relaxation rate of persistent current is studied theoretically in superconducting polycrystalline thin films. It is shown that varying the material parameters of grain anisotropy, grain size and film thickness does guide to a change of the current relaxation rate (CRR) mode. The point of degeneracy of CRR was obtained. The film-thickness dependent maxima are found in the behavior of CRR.
- Subjects
PERSISTENT currents; POLYCRYSTALS; SUPERCONDUCTING thin films; THICKNESS measurement; PARTICLE size distribution
- Publication
International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2014, Vol 28, Issue 22, p-1
- ISSN
0217-9792
- Publication type
Article
- DOI
10.1142/S0217979214501525