Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleAll‐Transfer Electrode Interface Engineering Toward Harsh‐Environment‐Resistant MoS<sub>2</sub> Field‐Effect Transistors.AuthorsWu, Yonghuang; Xin, Zeqin; Zhang, Zhibin; Wang, Bolun; Peng, Ruixuan; Wang, Enze; Shi, Run; Liu, Yiqun; Guo, Jing; Liu, Kaihui; Liu, KaiPublicationAdvanced Materials, 2023, Vol 35, Issue 18, p1ISSN0935-9648Publication typeArticleDOI10.1002/adma.202210735