Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleSub-5-nm Gaps Prepared by On-Wire Lithography: Correlating Gap Size with Electrical Transport.AuthorsQin, Lidong; Jang, Jae-Won; Huang, Ling; Mirkin, Chad A.PublicationSmall, 2007, Vol 3, Issue 1, p86ISSN1613-6810Publication typeArticleDOI10.1002/smll.200600386