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- Title
Mapping of flag smut resistance in common wheat.
- Authors
Toor, Arvinder; Bansal, Urmil; Bariana, Harbans
- Abstract
Flag smut, caused by Urocystis agropyri, has been a problem in wheat production, but its incidence has declined with the use of resistant varieties and seed dressing. Diamondbird, an Australian wheat cultivar that carries high levels of resistance to flag smut, was crossed with susceptible Chinese landrace TH3929 and a doubled haploid (DH) population was developed. A linkage map comprising 386 markers was used for detection of genomic regions controlling flag smut resistance. Composite interval mapping identified five quantitative trait loci (QTL) with significant effects for flag smut resistance. QTL QFs.sun- 3AL, QFs.sun- 6AS, QFs.sun- 1BL and QFs.sun- 5BS were contributed by Diamondbird. Although TH3929 was susceptible, it contributed a minor QTL QFs.sun- 3AS. QTL QFs.sun- 3AL and QFs.sun- 6AS were detected in both seasons and each explained more than 17 % of the variation in flag smut response. Other QTL QFs.sun- 3AS, QFs.sun- 1BL and QFs.sun- 5BS explained 5-10 % of the phenotypic variation. DH lines that showed low flag smut levels carried combinations of three or more QTL. This is the first report on chromosomal location of flag smut resistance in a modern common wheat cultivar.
- Subjects
VEGETATION mapping; SMUT diseases; WHEAT disease &; pest resistance; UROCYSTIS; WHEAT products; WHEAT varieties; PLANT genetics
- Publication
Molecular Breeding, 2013, Vol 32, Issue 3, p699
- ISSN
1380-3743
- Publication type
Article
- DOI
10.1007/s11032-013-9903-3