Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleRF and broadband noise investigation in High-k/Metal Gate 28-nm CMOS bulk transistor.AuthorsDanneville, F.; Poulain, L.; Tagro, Y.; Lepilliet, S.; Dormieu, B.; Gloria, D.; Scheer, P.; Dambrine, G.PublicationInternational Journal of Numerical Modelling, 2014, Vol 27, Issue 5/6, p736ISSN0894-3370Publication typeArticleDOI10.1002/jnm.1972