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- Title
Tunneling interferometry and measurement of the thickness of ultrathin metallic Pb(111) films.
- Authors
Ustavshchikov, S.; Putilov, A.; Aladyshkin, A.
- Abstract
Spectra of the differential tunneling conductivity for ultrathin lead films grown on Si(111) 7 × 7 single crystals with a thickness of 9 to 50 ML have been studied by low-temperature scanning tunneling microscopy and spectroscopy. The presence of local maxima of the tunneling conductivity is characteristic of such systems. The energies of maxima of the differential conductivity are determined by the spectrum of quantum-confined states of electrons in a metallic layer and, consequently, the local thickness of the layer. It has been shown that features of the microstructure of substrates, such as steps of monatomic height, structural defects, and inclusions of other materials covered with a lead layer, can be visualized by bias-modulation scanning tunneling spectroscopy.
- Subjects
LEAD; SINGLE crystals spectra; MICROSTRUCTURE; QUANTUM tunneling composites; QUANTUM states
- Publication
JETP Letters, 2017, Vol 106, Issue 8, p491
- ISSN
0021-3640
- Publication type
Article
- DOI
10.1134/S0021364017200127