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- Title
Effects of ferroelectric/metal interface on the electric properties of PMN-PT thin films epitaxially grown on Si substrates.
- Authors
Wang, W.; Zhu, Q.; Li, X.; Yang, M.; Gao, X.; Zhao, X.
- Abstract
Lead magnesium niobate-lead titanate 0.72Pb(MgNb)O-0.28PbTiO (PMN-PT) ferroelectric thin films were deposited on SrRuO (SRO), SrTiO, and TiN-buffered Si substrates by pulsed laser deposition. X-ray diffraction θ-2 θ and Phi scans reveal that PMN-PT films were epitaxially grown on Si substrates. Pt, Al, and Gd metals were employed as top electrodes to investigate the ferroelectric and dielectric properties of these metal/PMN-PT/SRO capacitors. It was found that the coercive field ( E) of the Gd(or Al)/PMN-PT/SRO capacitor is 4.5 times larger than that of the Pt/PMN-PT/SRO capacitor while the permittivity for the former is only ~27 % of that for the latter, which is analyzed using the model for metal-ferroelectric-metal heterostructures with Schottky contacts. Compared with the Pt/PMN-PT/SRO capacitor, the higher E and lower permittivity of the Gd(or Al)/PMN-PT/SRO capacitor are attributed to the stronger space charge field at the Gd(or Al)/PMN-PT interface. The capacitance-voltage characteristics of the metal/PMN-PT/SRO capacitors were also discussed.
- Subjects
FERROELECTRICITY; ELECTRIC properties of metals; LEAD magnesium niobate; LEAD titanate; THIN films; X-ray diffraction; PULSED laser deposition; EPITAXY; SILICON; CAPACITORS
- Publication
Journal of Materials Science: Materials in Electronics, 2013, Vol 24, Issue 10, p3782
- ISSN
0957-4522
- Publication type
Article
- DOI
10.1007/s10854-013-1318-8