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- Title
Radiation Hardened by Design-based Voltage Controlled Oscillator for Low Power Phase Locked Loop Application.
- Authors
Ahirwar, Rachana; Pattanaik, Manisha; Srivastava, Pankaj
- Abstract
A radiation-hardened-by-design (RHBD) current-starved-ring voltage-controlled oscillator (CSR-VCO) design is proposed based on the separation of gate input technique to mitigate single event effects (SEEs) for phase-locked loop (PLL) implementation. A double-exponential (DE) current model is used to analyze the effect of single event transient (SET) at the output of the proposed RHBD CSR-VCO. The proposed RHBD CSR-VCO is implemented in United Microelectronics Corporation (UMC) 65 nm CMOS technology and a 71.6% improvement is achieved in phase displacement as compared to conventional VCO. The oscillation frequency of 1.75 GHz is obtained for the proposed RHBD CSR-VCO with a tuning range from 0.40 GHz to 2.23 GHz and power dissipation of 1.368 mW. The proposed RHBD CSR-VCO is protected against radiation with deposited charges up to 1050 fC and achieved a higher figure-of-merit (FOM) when compared to the recently reported VCOs and PLLs. This shows that even in a radiation-prone environment, the RHBD PLL can achieve excellent performance and be employed successfully in low-power, high-speed communication applications.
- Subjects
VOLTAGE-controlled oscillators; PHASE-locked loops; SINGLE event effects; FREQUENCIES of oscillating systems; RADIATION
- Publication
Journal of Electronic Testing, 2024, Vol 40, Issue 2, p171
- ISSN
0923-8174
- Publication type
Article
- DOI
10.1007/s10836-024-06113-x