Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleInfluence of interfacial depth on depth resolution during GDOES depth profiling analysis of thin alumina films.AuthorsShimizu, K.; Habazaki, H.; Skeldon, P.; Thompson, G. E.; Marcus, R. K.PublicationSurface & Interface Analysis: SIA, 2001, Vol 31, Issue 9, p869ISSN0142-2421Publication typeArticleDOI10.1002/sia.1120