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XPS and UPS studies of gas-phase oxidation, electrochemistry and corrosion behaviour of Ti and Ti5Ta.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 309, doi. 10.1002/sia.740160164
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- Article
Application of factor analysis to the AES and XPS study of the oxidation of chromium.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 178, doi. 10.1002/sia.740160135
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- Article
Surface characterization of Cu<sub> x/2</sub>Cd<sub>1− x</sub>In<sub>2+ x/2</sub>S<sub>4</sub> model catalysts.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 352, doi. 10.1002/sia.740160175
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XPS study of MnO<sub>2</sub> minerals treated by bioleaching.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 571, doi. 10.1002/sia.7401601120
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Studies of the surface of mass standards.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 218, doi. 10.1002/sia.740160146
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SIMS of microelectronic structures using a liquid metal ion gun.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 70, doi. 10.1002/sia.740160117
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Surface characterization of plasma-treated PTFE.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 412, doi. 10.1002/sia.740160186
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XPS and UPS examinations of Fe53Ni and Fe10Ni in 1 M NaOH and 0.005 M H<sub>2</sub>SO<sub>4</sub>.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 271, doi. 10.1002/sia.740160157
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- Article
Structural characterization of supported chromium clusters by extended energy-loss fine structure.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 14, doi. 10.1002/sia.740160106
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- Article
XPS/SEM characterization of surface-treated carbon fibres.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 468, doi. 10.1002/sia.740160197
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- Article
Standard reference spectra for XPS and AES: Their derivation, validation and use.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 144, doi. 10.1002/sia.740160128
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- Article
Determination of the centroid depths of the depth profiles of ion-implanted analytes by angle-resolved electron microbeam analysis.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 321, doi. 10.1002/sia.740160168
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- Article
Quantitative surface analysis (AES) of SiC.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 199, doi. 10.1002/sia.740160139
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- Article
Novel chromium layers formed by nitrogen-ion implantation of conventional and ABCD electrodeposited films, part 4.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 488, doi. 10.1002/sia.7401601102
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- Article
XPS intensities and binding energy shifts as metal dispersion parameters in Ni/SiO<sub>2</sub> catalysts.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 375, doi. 10.1002/sia.740160179
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- Article
Surface analysis to study the improvements of silicon nitride/gallium arsenide interface properties.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 41, doi. 10.1002/sia.740160112
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- Article
Influence of plasma pretreatment of polypropylene on the adhesion with aluminium: An Auger spectroscopic study.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 241, doi. 10.1002/sia.740160152
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- Article
Chemical reactions induced in polymers by keV ions, electrons and photons.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 407, doi. 10.1002/sia.740160185
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- Article
Temperature dependence of the phosphorus segregation at the twin boundary in an Fe-4 at.% Si alloy.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 546, doi. 10.1002/sia.7401601113
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- Article
Comparative study of TiN<sub> x</sub> films deposited by reactive ion beam sputtering at 77 and 300 K.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 510, doi. 10.1002/sia.7401601106
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Electron spectroscopic investigation of segregation of non-metallic impurities in iron.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 562, doi. 10.1002/sia.7401601117
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A time-of-flight study of water molecular ion and neutral scattering from copper surfaces.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 154, doi. 10.1002/sia.740160130
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- Article
In-depth profiling of hydrogen in oxidic multilayer systems.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 331, doi. 10.1002/sia.740160170
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Application of nuclear methods to the study of transfer wear of PTFE on stainless steel and silicon.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 385, doi. 10.1002/sia.740160181
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Determination of the intensity-energy response function of the ISA Riber MAC 2 electron analyser.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 209, doi. 10.1002/sia.740160141
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Masthead.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. fmi, doi. 10.1002/sia.740160101
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- Article
AES and HREELS studies of the Cu/MgO(100) interface.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 446, doi. 10.1002/sia.740160192
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- Article
Influence of the inelastic background on the accuracy of factor analysis of electron spectra.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 173, doi. 10.1002/sia.740160134
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- Article
A surface study of the CO hydrogenation reaction on fused iron catalysts.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 347, doi. 10.1002/sia.740160174
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Analysis of insulating specimens with the Cameca IMS4f.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 9, doi. 10.1002/sia.740160105
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Surface analysis of monomolecular layers with time-of-flight SIMS.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 216, doi. 10.1002/sia.740160145
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An XPS study of the initial stages of oxidation of hafnium.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 304, doi. 10.1002/sia.740160163
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- Article
An XPS study of GaN thin films on GaAs.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 65, doi. 10.1002/sia.740160116
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Surface and microanalytical studies on the corrosion of a Ti5Ta alloy in concentrated nitric acid.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 265, doi. 10.1002/sia.740160156
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Effect of pretreatment on a platinized tin oxide catalyst used for low-temperature Co oxidation.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 369, doi. 10.1002/sia.740160178
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Microanalysis of inclusion/matrix interfaces in weld metals.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 504, doi. 10.1002/sia.7401601105
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The calibration of electron spectrometer intensity-energy response functions.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 221, doi. 10.1002/sia.740160149
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Application of X-ray emission spectrometry (LEEIXS) to the study of insulator surface-molecular characterization of some metallic oxides or compounds.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 429, doi. 10.1002/sia.740160189
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- Article
Influence of surface defects on the mechanical properties of yttria ceramics.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 467, doi. 10.1002/sia.740160196
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- Article
Comparison of AES analyses of transition-metal nitride coatings with carrier-gas heat extraction analyses.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 540, doi. 10.1002/sia.7401601112
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The reliability of quantitative analysis with AES.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 140, doi. 10.1002/sia.740160127
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- Article
XPS in the investigation of electrode surfaces: Analytical characterization of the CuO cathode in the Li/CuO cell.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 317, doi. 10.1002/sia.740160167
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- Article
An XPS study of Cs<sub>2</sub>Te photocathode materials.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 193, doi. 10.1002/sia.740160138
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Surface compounds and surface precipitates on single crystal surfaces.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 483, doi. 10.1002/sia.7401601101
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Emissivity as a method of thin film analysis.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 25, doi. 10.1002/sia.740160109
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- Article
Surface structure and composition of silver-palladium alloys.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 560, doi. 10.1002/sia.7401601116
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SIMS analysis of InP, GaAs and InGaAs layers grown by chemical beam epitaxy.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 36, doi. 10.1002/sia.740160111
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- Article
Characterization by XPS and XAS of supported Pt/TiO<sub>2</sub>CeO<sub>2</sub> catalysts.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 341, doi. 10.1002/sia.740160173
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- Article
Surface characterization of rhodium-copper alloys.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 526, doi. 10.1002/sia.7401601109
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- Article
XPS investigation on the corrosion behaviour of nickel in sea water.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 299, doi. 10.1002/sia.740160162
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- Article