Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleData Driven In Situ TEM: A Path Towards Accurate Characterization of Radiation Damage in Structural Materials.AuthorsBurns, Kory; Kohnert, Caitlin; Li, Nan; Scott, Mary C; Hattar, KhalidSubjectsTRANSMISSION electron microscopy; RADIATION; CONSTRUCTION materialsPublicationMicroscopy & Microanalysis, 2023, p1555ISSN1431-9276Publication typeAbstractDOI10.1093/micmic/ozad067.800