Found: 203
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Spectroscopy of Si vacancies formed with a scanning tunneling microscope.
- Published in:
- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 8, p. S213, doi. 10.1007/s003390100678
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- Article
Editorial.
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- 2001
- Publication type:
- Editorial
Electronic structure of an adsorbate in a resonator.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 8, p. S147, doi. 10.1007/s003390100672
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- Article
Spin-polarized scanning tunneling spectroscopy on Fe nanowires.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 8, p. S149, doi. 10.1007/s003390100792
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- Article
Electric-dipole layer on Au(111) surfaces.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 8, p. S181, doi. 10.1007/s003390100675
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- Article
Structure comparison of nanotubes produced by different processes.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 8, p. S185, doi. 10.1007/s003390100665
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- Article
Atomic force microscopy investigation of electrochemically produced carbon nanotubes.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 8, p. S189
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- Article
Local spectroscopy of two-dimensional states in Na films on Cu(111).
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 8, p. S155, doi. 10.1007/s003390100674
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- Article
Imaging surface electronic structure of NiAl(110) using low-temperature scanning tunneling microscopy.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 8, p. S159, doi. 10.1007/s003390100747
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- Article
Cracking self-assembled InAs quantum dots.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 8, p. S205, doi. 10.1007/s003390100663
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- Article
Remote projection and quantum mirages in STS and STM.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 8, p. S163, doi. 10.1007/s003390100791
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- Article
Electromagnetic coupling at an atomic scale.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 8, p. S173, doi. 10.1007/s003390100671
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- Article
Deposition of gold clusters on atomically flat gold films.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 8, p. S177, doi. 10.1007/s003390100660
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- Article
The physical principles of scanning capacitance spectroscopy.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 8, p. S243, doi. 10.1007/s003390100793
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- Article
Recent developments in scanning tunneling spectroscopy of semiconductor surfaces.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 8, p. S193, doi. 10.1007/s003390100718
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- Publication type:
- Article
An ultralow-temperature scanning tunnelling microscope.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 8, p. S253, doi. 10.1007/s003390100661
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- Article
Microscopic properties of the SrTiO[sub 3] (100) surface.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 8, p. S277, doi. 10.1007/s003390100662
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- Publication type:
- Article
Optical detection of ballistically injected electrons in III/V heterostructures.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 8, p. S201, doi. 10.1007/s003390100669
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- Publication type:
- Article
Low-temperature scanning tunneling microscopy of subsurface shallow dopants: depth dependence of the corrugation for the GaAs(110) surface.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 8, p. S209, doi. 10.1007/s003390100659
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- Publication type:
- Article
Atomic-scale studies of impurities in superconductors with a scanning tunneling microscope.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 8, p. S257, doi. 10.1007/s003390100748
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- Publication type:
- Article
Contrast inversion in nc-AFM on Si(111)7x7 due to short-range electrostatic interactions.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 7, p. S19, doi. 10.1007/s003390100629
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- Publication type:
- Article
Time-dependent oscillations of tunneling current on partially oxidized Si (111) surfaces.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 8, p. S217, doi. 10.1007/s003390100677
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- Publication type:
- Article
Conducting-AFM spectroscopy on ultrathin SiO[sub 2] films.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 8, p. S223, doi. 10.1007/s003390100676
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- Publication type:
- Article
Ballistic-electron-emission spectroscopy.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 8, p. S227, doi. 10.1007/s003390100749
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- Article
Magnetic field effects and k[sub ∥] -filtering in BEEM on GaAsAlGaAs resonant tunneling structures.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 8, p. S233, doi. 10.1007/s003390100673
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- Article
Optical properties of a tip-induced quantum dot.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 8, p. S239, doi. 10.1007/s003390100668
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- Publication type:
- Article
Corrosion and surface spectroscopies of high-temperature superconductors.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 8, p. S271, doi. 10.1007/s003390100658
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- Publication type:
- Article
Local magnetic measurements of composition-spread manganese oxide thin films with a scanning SQUID microscope.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 8, p. S273, doi. 10.1007/s003390100666
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- Publication type:
- Article
Time-resolved STM studies of atom-movement effects on ionic-electronic conductor surfaces.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 8, p. S281, doi. 10.1007/s003390100679
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- Publication type:
- Article
Direct observations of vortices in a high-T[sub c] superconductor (La[sub 1-x] Sr[sub x] )[sub 2] CuO[sub 4] by scanning SQUID microscopy.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 8, p. S263, doi. 10.1007/s003390100667
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- Publication type:
- Article
Scanning tunneling microscopy and spectroscopy on cracked surfaces of superconducting CeRu[sub 2].
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 8, p. S267, doi. 10.1007/s003390100657
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- Publication type:
- Article
Editorial.
- Published in:
- 2001
- Publication type:
- Editorial
Adventures in attonewton force detection.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 7, p. S3, doi. 10.1007/s003390100729
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- Publication type:
- Article
Noncontact AFM imaging on a Si(111)2x1-Sb surface with occupied lone-pair orbitals.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 7, p. S11, doi. 10.1007/s003390100717
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- Publication type:
- Article
Imaging silicon by atomic force microscopy with crystallographically oriented tips.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 7, p. S15, doi. 10.1007/s003390100627
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- Publication type:
- Article
Differential friction force spectroscopy of micropatterned organosilane self-assembled monolayers.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 8, p. S285, doi. 10.1007/s003390100670
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- Publication type:
- Article
Non-contact atomic force microscopy of an antiferromagnetic NiO(100) surface using a ferromagnetic tip.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 7, p. S23, doi. 10.1007/s003390100722
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- Publication type:
- Article
Dynamic low-temperature scanning force microscopy on nickel oxide (001).
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 7, p. S27, doi. 10.1007/s003390100731
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- Publication type:
- Article
Imaging problems on insulators: What can be learnt from NC-AFM modelling on CaF[sub 2] ?
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 7, p. S31, doi. 10.1007/s003390100635
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- Publication type:
- Article
Simulation of NC-AFM images of xenon(111).
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 7, p. S35
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- Publication type:
- Article
Theoretical evaluation of the frequency shift and dissipated power in noncontact atomic force microscopy.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 7, p. S39, doi. 10.1007/s003390100632
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- Publication type:
- Article
Measuring viscous dissipative interactions in dynamic force microscopy.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 7, p. S43
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- Article
A mechanical approach to the dissipation process in NC-AFM: experiments, model and simulation.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 7, p. S47, doi. 10.1007/s003390100634
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- Publication type:
- Article
Simultaneous imaging of tunneling current and damping energy by noncontact-AFM in ultra-high vacuum.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 7, p. S51, doi. 10.1007/s003390100653
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- Publication type:
- Article
The measurement of hysteretic forces by dynamic AFM.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 7, p. S55, doi. 10.1007/s003390100645
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- Publication type:
- Article
Tip and surface properties from the distance dependence of tip-surface interactions.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 7, p. S59, doi. 10.1007/s003390100628
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- Publication type:
- Article
Effect of tip morphology on AFM images.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 7, p. S63, doi. 10.1007/s003390100639
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- Publication type:
- Article
Calibration of a scanning Joule expansion microscope (SJEM).
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 7, p. S67, doi. 10.1007/s003390100648
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- Publication type:
- Article
Instrumentation of STM and AFM combined with transmission electron microscope.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 7, p. S71, doi. 10.1007/s003390100636
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- Publication type:
- Article
AFM detection of the mechanical resonances of coiled carbon nanotubes.
- Published in:
- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 7, p. S75, doi. 10.1007/s003390100644
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- Publication type:
- Article