Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.Title3aA_MI-8A comparative study of patch-based noise reduction methods for atomic-resolution XEDS maps.AuthorsYamamoto, Tomokazu; Yang, Wenhui; Aso, Kohei; Yasuda, Kazuhiro; Matsumura, SyoSubjectsNOISE control; ENERGY dispersive X-ray spectroscopy; CHARACTERISTIC X-ray spectrumPublicationMicroscopy, 2018, Vol 67, pi28ISSN2050-5698Publication typeAbstractDOI10.1093/jmicro/dfy082