Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleMeasurement of mobility in dual-gated MoS<sub>2</sub> transistors.AuthorsFuhrer, Michael S.; Hone, JamesAbstractSeveral letters to the editor are presented in response to articles published in previous issues, including measurement of mobility in dual-gated MoS2 transistors and the use of dielectric screening to increase the mobility of monolayer MoS2.SubjectsLETTERS to the editor; SEMICONDUCTORS; SOLID state electronics; DIELECTRICS; TRANSISTORSPublicationNature Nanotechnology, 2013, Vol 8, Issue 3, p146ISSN1748-3387Publication typeArticleDOI10.1038/nnano.2013.30