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- Title
In situ break-junction sample holder for transmission electron microscopy.
- Authors
Eswara Moorthy, Santhana K.; Le Goff, Gerald; Viret, Michel; Kociak, Mathieu
- Abstract
In this article, we report on the design and construction of an in situ break-junction sample holder for transmission electron microscopy. The holder is based on the differential-screw mechanism. The technical details and a comprehensive consideration to all relevant critical issues surrounding the instrumentation procedure are presented. An application of the newly developed instrument is demonstrated using the example of a micro-scale gold wire. We also provide a detailed discussion on the challenges involved and the pitfalls to avoid in developing similar in situ holders.
- Subjects
GOLD wire; ELECTRONIC equipment; TRANSMISSION electron microscopy; ELECTRIC conductivity; DIELECTRIC properties
- Publication
European Physical Journal - Applied Physics, 2013, Vol 64, Issue 3, p00
- ISSN
1286-0042
- Publication type
Article
- DOI
10.1051/epjap/2013130365