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- Title
ISTFA 2013 Contactless Fault Isolation User's Group.
- Authors
Pardy, Patrick; Niu, Baohua
- Abstract
Information about the Contactless Fault Isolation User's Group session of the 39th International Symposium for Testing and Failure Analysis (ISTFA) held at the McEnery Convention Center in San Jose, California from November 3-7, 2013 is presented. Topics discussed include centric solid immersion lenses and impact of polarization on imaging. The symposium featured several executives of the electronic devices industry including Paiboon Tangyunyong, Yullin Kim and Lian-Ser Koh.
- Subjects
ELECTRONIC appliance testing; FAILURE analysis; SOLID immersion lenses; OPTICAL polarization; PAIBOON Tangyunyong; YULLIN Kim; LIAN-Ser Koh; CONFERENCES &; conventions
- Publication
Electronic Device Failure Analysis, 2014, Vol 16, Issue 1, p31
- ISSN
1537-0755
- Publication type
Proceeding
- DOI
10.31399/asm.edfa.2014-1.p031