Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleMulticrystalline Informatics Applied to Multicrystalline Silicon for Unraveling the Microscopic Root Cause of Dislocation Generation.AuthorsYamakoshi, Kenta; Ohno, Yutaka; Kutsukake, Kentaro; Kojima, Takuto; Yokoi, Tatsuya; Yoshida, Hideto; Tanaka, Hiroyuki; Liu, Xin; Kudo, Hiroaki; Usami, NoritakaPublicationAdvanced Materials, 2024, Vol 36, Issue 8, p1ISSN0935-9648Publication typeArticleDOI10.1002/adma.202308599