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- Title
Gamma generalized linear model‐based control charts for high‐purity processes.
- Authors
Rizzo, Caterina; Bucchianico, Alessandro Di
- Abstract
Statistical process monitoring of high‐purity manufacturing processes becomes challenging if the defect rate depends on the fluctuations of a set of covariates (e.g., inspected weight, volume, temperature). This paper applies the generalized linear model framework to statistical process control for detecting contextual anomalies in high‐purity processes. Different types of predictive residuals (i.e., Pearson, deviance, and quantile) and recursive residuals are considered, and the performance of these schemes is compared via a simulation study.
- Subjects
QUALITY control charts; STATISTICAL process control; LINEAR statistical models; MANUFACTURING processes
- Publication
Quality & Reliability Engineering International, 2024, Vol 40, Issue 1, p170
- ISSN
0748-8017
- Publication type
Article
- DOI
10.1002/qre.3348