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- Title
Using Irradiation-Acquisition Interleaved Time-Integrated Imaging to Assess Delayed Luminescence and the Noise-Laden Residual Spontaneous Photon Emission of Yeast.
- Authors
Piao, Daqing
- Abstract
Featured Application: The approach presented in this work may be applicable to imaging technology relevant to assessing oxidative stress. Delayed luminescence from organisms informs oxidative stress that may be modulable by external stimulations. In the absence of external stress causing delayed luminescence, organisms may produce spontaneous ultraweak photon emission due to the residual oxygen demand. To better understand the oxidative state of an organism, it is desirable to acquire the delayed luminescence to reach the phase wherein the ultraweak photon emission resides. This, however, is challenging due to the significant difference in the order of magnitude of the photon counts between the two types of photon emission. Conventional time-gated measurement requires a high dynamic range to assess the noise-level photon emission, whereas simple long exposure can miss the kinetics of luminescence. There may be a compromise to be made between robustly acquiring the decay kinetics of the delayed luminescence and reliably acquiring the noise-laden spontaneous photon emission. We demonstrate an irradiation-acquisition interleaved time-integrated imaging approach that may enable the reliable acquisition of slow-decay delayed luminescence down to the level of ultraweak photon emission. Repetitive irradiation was interleaved with a gradually increased time of acquisition to assess the integrated time course of the post-irradiation luminescence. Such instrument configuration performed on yeast facilitated the use of time differentiation to assess the delayed luminescence down to the noise-level ultraweak photon emission at the expense of the total time of acquisition.
- Subjects
PHOTON emission; LUMINESCENCE; DELAYED fluorescence; LUMINESCENCE measurement; YEAST; PHOTON counting; OXIDATIVE stress
- Publication
Applied Sciences (2076-3417), 2024, Vol 14, Issue 6, p2392
- ISSN
2076-3417
- Publication type
Article
- DOI
10.3390/app14062392