Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleMultiwavelength fringe scanning profilometry for wide gapped sample.AuthorsMinghong Tsai; Hongxin Huang; Itoh, Masahide; Yatagai, ToyohikoPublicationOptical Engineering, 2000, Vol 39, Issue 4, p970ISSN0091-3286Publication typeArticleDOI10.1117/1.602456