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- Title
The Fractal Properties of a Geometric Model of the High-Resolution X-ray Diffractor.
- Authors
Latush, E. M.; Mazuritsky, M. I.
- Abstract
Perfect and mosaic crystals are conventionally used in X-ray monochromators operating in the energy range from several hundred to tens of thousands of electronvolts. The focusing X-ray optics for nonparallel beams employs either cylindrical bent crystals (the methods of Johann [1], Johansson [2], and Cauchois [3]) or crystals with spherical or toroidal [4] bending of the crystallographic planes. Special variants of high-resolution stepped-crystal diffractors [5-8] were developed to study the possibility of high-precision focusing of a monochromatic X-ray radiation. The fractal properties of a geometric model of such a high-resolution stepped-crystal diffractor are considered.
- Subjects
X-ray diffraction; ELECTROOPTICS
- Publication
Technical Physics Letters, 2001, Vol 27, Issue 9, p781
- ISSN
1063-7850
- Publication type
Article
- DOI
10.1134/1.1407358