We found a match
Your institution may have access to this item. Find your institution then sign in to continue.
- Title
Canadian Light Source — Optical Metrology Facility.
- Authors
Yates, Brian W.; Maxwell, Dylan G.
- Abstract
The Canadian Light Source Optical Metrology Facility serves as a support facility and provides metrological services required by the synchrotron beamlines. The Facility consists of three state-of-the-art instruments: a Micromap 570 surface profiler, an Ocean Optics long trace profilometer, and a Zygo Verifire AT Fizeau interferometer. These three complementary measurement systems permit a complete analysis of the synchrotron beamline optical components. The systems will be discussed in detail, noting synchrotron and industrial applications where possible.
- Subjects
SYNCHROTRONS; LASER beams; OPTICS; INTERFEROMETERS; OPTOELECTRONIC devices
- Publication
Canadian Journal of Chemistry, 2007, Vol 85, Issue 10, p685
- ISSN
0008-4042
- Publication type
Article
- DOI
10.1139/V07-053