Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleDepth profiling techniques: how PIXE compares to NRP and MEIS?AuthorsDos Santos, C. E. I.; Shubeita, S. M.; Amaral, L.; Grande, P. L.; Dias, J. F.PublicationXRS: X-ray Spectrometry, 2011, Vol 40, Issue 3, p157ISSN0049-8246Publication typeArticleDOI10.1002/xrs.1327