Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleComparative studies of constrast mechanisms in electron and ion induced secondary electron images.AuthorsBrown, A.; Briggs, D.; Lai, S. Y.; Vickerman, J. C.PublicationSurface & Interface Analysis: SIA, 1986, Vol 9, Issue 1, p70ISSN0142-2421Publication typeArticleDOI10.1002/sia.740090116