Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleP‐134: Detection of Ion Impurities in Organic Thin Films by Displacement‐Current Measurement Method.AuthorsIwata, Takuro; Inoue, Masaru; Oyabu, Noriaki; Ohdaira, Keisuke; Murata, HideyukiPublicationSID Symposium Digest of Technical Papers, 2022, Vol 53, Issue 1, p1513ISSN0097-966XPublication typeArticleDOI10.1002/sdtp.15807