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- Title
Focus image scanning microscopy for sharp and gentle super-resolved microscopy.
- Authors
Tortarolo, Giorgio; Zunino, Alessandro; Fersini, Francesco; Castello, Marco; Piazza, Simonluca; Sheppard, Colin J. R.; Bianchini, Paolo; Diaspro, Alberto; Koho, Sami; Vicidomini, Giuseppe
- Abstract
To date, the feasibility of super-resolution microscopy for imaging live and thick samples is still limited. Stimulated emission depletion (STED) microscopy requires high-intensity illumination to achieve sub-diffraction resolution, potentially introducing photodamage to live specimens. Moreover, the out-of-focus background may degrade the signal stemming from the focal plane. Here, we propose a new method to mitigate these limitations without drawbacks. First, we enhance a STED microscope with a detector array, enabling image scanning microscopy (ISM). Therefore, we implement STED-ISM, a method that exploits the working principle of ISM to reduce the depletion intensity and achieve a target resolution. Later, we develop Focus-ISM, a strategy to improve the optical sectioning and remove the background of any ISM-based imaging technique, with or without a STED beam. The proposed approach requires minimal architectural changes to a conventional microscope but provides substantial advantages for live and thick sample imaging. Super-resolution microscopy techniques can be challenging for live cells and thick samples. Here, the authors propose a method to reduce beam intensity and remove out-of-focus fluorescence background in image-scanning microscopy (ISM) and its combination with stimulated emission depletion (STED).
- Subjects
FOCAL planes; MICROSCOPY; STIMULATED emission; HIGH resolution imaging; RADIOSTEREOMETRY
- Publication
Nature Communications, 2022, Vol 13, Issue 1, p1
- ISSN
2041-1723
- Publication type
Article
- DOI
10.1038/s41467-022-35333-y