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- Title
STUDY OF THE INFLUENCE OF THERMAL EFFECTS ON THE ELECTROMIGRATION TESTS.
- Authors
Abdeslam, Sa&adot;d; Lormand, Gera&rdot;d
- Abstract
A simple one-dimensional thermal model of the electromigration phenomenon shows that the usual measurement methods of the temperature during lifetime tests usually lead to an erroneous determination of Black's relation parameters, n and Q. The effects of the current density and the temperature estimation method on the errors on n and Q are analysed. An estimation of the temperature of the site where the flux divergence is maximum allows us to understand the behaviour of n and Q. The difference between real and apparent activation energy at low current densities is also calculated.
- Subjects
ELECTRODIFFUSION; CORRECTIVE advertising; DIFFERENCES; HUMAN life cycle; INTEGRATED circuits; INTEGRATED circuit interconnections
- Publication
Quality & Reliability Engineering International, 1995, Vol 11, Issue 1, p27
- ISSN
0748-8017
- Publication type
Article
- DOI
10.1002/qre.4680110105