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- Title
Yield-Oriented Logic Failure Characterization for FA Prioritization.
- Authors
Szu Huat Goh; Boon Lian Yeoh; Guo Feng You; Lam, Jeffrey
- Abstract
The article focuses on the importance of prioritization, a standard practice in software fault isolation (FI) tools such as static random access memory (SRAM) bitmapping and electronic device automation, failure analysis (FA) resource optimization in semiconductor manufacturing industry. It discusses the effectiveness of yield-oriented prioritization approach for product logic FA.
- Subjects
FAILURE analysis; SEMICONDUCTOR failures; SYSTEM failures; SEMICONDUCTOR industry; ELECTRONIC circuit protection
- Publication
Electronic Device Failure Analysis, 2014, Vol 16, Issue 3, p4
- ISSN
1537-0755
- Publication type
Article
- DOI
10.31399/asm.edfa.2014-3.p004