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- Title
Mimicking an Atomically Thin 'Vacuum Spacer' to Measure the Hamaker Constant between Graphene Oxide and Silica.
- Authors
Chu, Liangyong; Korobko, Alexander V.; Cao, Anping; Sachdeva, Sumit; Liu, Zhen; de Smet, Louis C. P. M.; Sudhölter, Ernst J. R.; Picken, Stephen J.; Besseling, Nicolaas A. M.
- Abstract
The Hamaker constant between graphene oxide and silica, which quantifies the strength of van der Waals forces is determined, by mimicking a “vacuum spacer” in an atomic force microscopyforce tudy. It is demonstrated that, a 2D spacer is expected to yield an accurately defined separation, owing to the high atom density and strength in planar direction compared with other dimensional spacers.
- Subjects
GRAPHENE oxide; SILICA; VAN der Waals forces; ELECTROSTATICS; ADHESION
- Publication
Advanced Materials Interfaces, 2017, Vol 4, Issue 5, pn/a
- ISSN
2196-7350
- Publication type
Article
- DOI
10.1002/admi.201600495