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- Title
At-wavelength metrology of an X-ray mirror using a downstream wavefront modulator.
- Authors
Tunhe Zhou; Lingfei Hu; Hongchang Wang
- Abstract
At-wavelength metrology of X-ray optics plays a crucial role in evaluating the performance of optics under actual beamline operating conditions, enabling in situ diagnostics and optimization. Techniques utilizing a wavefront random modulator have gained increasing attention in recent years. However, accurately mapping the measured wavefront slope to a curved X-ray mirror surface when the modulator is downstream of the mirror has posed a challenge. To address this problem, an iterative method has been developed in this study. The results demonstrate a significant improvement compared with conventional approaches and agree with offline measurements obtained from optical metrology. We believe that the proposed method enhances the accuracy of at-wavelength metrology techniques, and empowers them to play a greater role in beamline operation and optics fabrication.
- Subjects
METROLOGY; X-ray optics; MIRRORS; X-rays; OPTICS
- Publication
Journal of Synchrotron Radiation, 2024, Vol 31, Issue 3, p432
- ISSN
0909-0495
- Publication type
Article
- DOI
10.1107/S1600577524002157