Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleDepth profiling analysis of barrier-type anodic aluminium oxide films formed on substrates of controlled roughness.AuthorsTrigoulet, N.; Tuccitto, N.; Delfanti, I.; Licciardello, A.; Molchan, I. S.; Skeldon, P.; Thompson, G. E.; Tempez, A.; Chapon, P.PublicationSurface & Interface Analysis: SIA, 2011, Vol 43, Issue 1/2, p183ISSN0142-2421Publication typeArticleDOI10.1002/sia.3410