Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleThe Possibility of TEM-based X-ray Microanalysis with a Microcalorimeter Detector.AuthorsKenik, E. A.; Anderson, I. M.; Joy, D. C.; Demers, H.AbstractExtended abstract of a paper presented at the Pre-Meeting Congress: Materials Research in an Aberration-Free Environment, at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, July 31 and August 1, 2004.PublicationMicroscopy & Microanalysis, 2004, Vol 10, Issue S03, p58ISSN1431-9276Publication typeArticleDOI10.1017/S1431927604555757