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- Title
The influence of yield model parameters on the probability of defect occurrence.
- Authors
Rakowski, Michał; Pleskacz, Witold A.
- Abstract
This paper describes the analysis of the influence of yield loss model parameters on the calculation of the probability of arising shorts between conducting paths in IC's. The characterization of the standard cell in AMS 0.8 µm CMOS technology is presented as well as obtained probability results and estimations of yield loss by changing values of model parameters.
- Subjects
MODELS &; modelmaking; INTEGRATED circuits; STANDARD cells; COMPLEMENTARY metal oxide semiconductors; DIGITAL electronics
- Publication
Journal of Telecommunications & Information Technology, 2007, Vol 2007, Issue 3, p101
- ISSN
1509-4553
- Publication type
Article