Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleThickness and angular dependence of the L-edge X-ray absorption of nickel thin films.AuthorsUfuktepe, Y.; Akgül, G.; Aksoy, F.; Nordlund, D.PublicationXRS: X-ray Spectrometry, 2011, Vol 40, Issue 6, p427ISSN0049-8246Publication typeArticleDOI10.1002/xrs.1362