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- Title
Interfaces: AFM extends its reach.
- Authors
Ruediger, Andreas; Rosei, Federico
- Abstract
The article discusses research by Kislon Voïtchovsky and colleagues, published in "Nature Nanotechnology" on how a commercial atomic force microscope (AFM) can be used to measure relative interface energies at solid/liquid interfaces. The experiments are conducted in liquid and therefore involve two liquid/surface interfaces. The researchers were able to establish the exact parameters needed for high-resolution imaging through a series of careful measurements.
- Subjects
VOITCHOVSKY, Kislon; ATOMIC force microscopy; MICROSCOPES; IMAGING systems; MEASUREMENT
- Publication
Nature Nanotechnology, 2010, Vol 5, Issue 6, p388
- ISSN
1748-3387
- Publication type
Article
- DOI
10.1038/nnano.2010.112