Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleDislocation Identification and Mapping in GaN by Electron Channeling Contrast Imaging.AuthorsPicard, Y.N.; Kamaladasa, R.J.; Liu, F.; Huang, L.; Porter, L.; Davis, R.F.AbstractExtended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.SubjectsELECTRIC properties of gallium nitride; CHANNELING (Physics)PublicationMicroscopy & Microanalysis, 2012, Vol 18, Issue S2, p718ISSN1431-9276Publication typeAbstractDOI10.1017/S1431927612005442