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- Title
Dielectric Properties of Ba<sub>0.8</sub> Ca<sub>0.2</sub> TiO<sub>3</sub>- Bi( Mg<sub>0.5</sub>, Ti<sub>0.5</sub>) O<sub>3</sub>- NaNbO<sub>3</sub> Ceramics.
- Authors
Zeb, Aurang; Milne, Steven J.; Damjanovic, D.
- Abstract
Ceramics in the system 0.45 Ba0.8 Ca0.2 TiO3-(0.55− x) Bi( Mg0.5 Ti0.5) O3- x NaNbO3, x = 0-0.02 were fabricated by a conventional solid-state reaction route. X-ray powder diffraction indicated cubic or pseudocubic symmetry for all samples. The parent 0.45 Ba0.8 Ca0.2 TiO3-0.55 Bi( Mg0.5 Ti0.5) O3 composition is a relaxor dielectric with a near-stable temperature coefficient of relative permittivity, εr = 950 ± 10% across the temperature range 80°C-600°C. Incorporation of NaNbO3 at x = 0.2 extends the lower working temperature to ≤25°C, with εr = 575% ± 15% from temperatures ≤25°C to >400°C, and tan δ < 0.025 from 25°C to 400°C. Values of dc resistivity ranged from ~109 Ω·m at 250°C to ~106 Ω·m at 500°C. The properties suggest that this material may be of interest for high-temperature capacitor applications.
- Subjects
CERAMICS; BARIUM compounds; X-ray diffraction; PERMITTIVITY measurement; CAPACITORS; CRYSTALLOGRAPHY
- Publication
Journal of the American Ceramic Society, 2013, Vol 96, Issue 12, p3701
- ISSN
0002-7820
- Publication type
Article
- DOI
10.1111/jace.12633