Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleMechanism of Biaxial Alignment of Oxide Thin Films during Ion-Beam-Assisted Deposition.AuthorsRessler, Kevin G.; Sonnenberg, Neville; Cima, Michael J.PublicationJournal of the American Ceramic Society, 1997, Vol 80, Issue 10, p2637ISSN0002-7820Publication typeArticleDOI10.1111/j.1151-2916.1997.tb03166.x