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- Title
Stability Considerations Using a Microscopic Stability Model Applied to a 2G Thin Film Coated Superconductor.
- Authors
Reiss, Harald
- Abstract
A numerical, finite element simulation of local temperature fields, critical current and transport current distributions is applied to a 2G thin film coated high-temperature superconductor. The focus is on simulation of quenches originating from transport current locally exceeding critical current density. As in previous reports, a statistical treatment of superconductor parameters (critical temperature, current and magnetic field) is applied for this analysis; it shall take into account uncertainties possibly arising from shortcomings in conductor manufacture or during measurements of their properties. The results of the calculations are used as quasi-boundary (driving) conditions for a subsequent transient microscopic numerical stability analysis. Traditionally, stability analysis usually applies analytic stability functions that incorporate conventional, phonon-related timescales, <italic>t</italic> and disturbances. The question is whether decay of electron pairs and subsequent relaxation of the excited state to a new dynamic equilibrium carrier concentration, the “electron aspect” of the stability problem, under the same disturbances, proceeds on another timescale, <italic>t</italic>′. Is this timescale identical to the traditional (phonon) timescale, <italic>t</italic>? If not, how large are the differences? The recently reported microscopic stability model, now applied to a thin film conductor, is consulted to find an answer to these questions. A <italic>time</italic> limit, <italic>t</italic>Quench, can be extracted from the simulations, as the time of immediate onset of a quench. This is a new approach in stability considerations since, conventionally, a <italic>temperature</italic> limit, <italic>T</italic> < <italic>T</italic>Crit, is set as stability criterion. If electrical operation or cooling conditions cannot immediately respond to this challenge, the thin film superconductor, if this time limit is exceeded, will hardly be able to return to zero loss current transport.
- Subjects
SUPERCONDUCTORS; RELAXATION (Nuclear physics); INTERACTING boson-fermion models; TIME-of-flight spectrometry; FINITE element method
- Publication
Journal of Superconductivity & Novel Magnetism, 2018, Vol 31, Issue 4, p959
- ISSN
1557-1939
- Publication type
Article
- DOI
10.1007/s10948-017-4245-8