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- Title
A high resolution X-ray crystal spectrometer to study electron and heavy-ion impact atomic collisions.
- Authors
Kumar, Ajay; Misra, D.; Kelkar, A. H.; Kadhane, U. R.; Thulasiram, K. V.; Tribedi, Lokesh C.
- Abstract
We have studied fast ion-atom and electron-atom collision processes using a reconditioned high resolution X-ray spectrometer. The X-rays, generated by the collisions, are dispersed by a curved ADP crystal (Johansson geometry) and detected by a gas proportional counter. A self-written LabVIEW based program has been used to give precise and controlled movement to the crystal and for data acquisition. The performance was tested by detecting the Kα diagram and satellite lines of several elements. The Kα satellite lines of Al have been studied in collision with 3-12 keV electrons and 40 MeV C4+ ions. In ion collisions as large as four L-vacancies are created simultaneously with the K-vacancy, compared to two satellites in case of the e-impact. In addition, we have measured the X-rays from H-, He- and Li-like Si ions which arise due to the electron loss/capture process in highly charged 80 MeV Si7+ ions in collision with thin carbon foil. Approximate charge state distribution has been obtained using this new technique.
- Subjects
ION-atom collisions; ELECTRON-atom collisions; SPECTRUM analysis instruments; X-rays; ELECTRON impact ionization
- Publication
Pramana: Journal of Physics, 2007, Vol 68, Issue 6, p983
- ISSN
0304-4289
- Publication type
Article
- DOI
10.1007/s12043-007-0097-2