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- Title
Confidence Intervals for Process Capability Indices for the Unbalanced One-Way Random Effect ANOVA Model.
- Authors
Jose, K. K.; Luke, Jane A.
- Abstract
Confidence intervals for process capability index Cpk are developed for the unbalanced one-way random effect model using Bissell's approximation method. The proposed limit is compared with the generalized lower confidence limit obtained using the generalized pivotal quantity method. To assess the accuracy of the method, a simulation study is presented. The results are illustrated with an industrial example. Copyright © 2011 John Wiley & Sons, Ltd.
- Subjects
CONFIDENCE intervals; STATISTICAL sampling; APPROXIMATION theory; FUNCTIONAL analysis; STATISTICAL hypothesis testing
- Publication
Quality & Reliability Engineering International, 2012, Vol 28, Issue 4, p371
- ISSN
0748-8017
- Publication type
Article
- DOI
10.1002/qre.1247