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- Title
APPLICATION OF PIXE- AND RBS-CHANNELING TO INVESTIGATIONS ON THE CHARACTERIZATION OF SINGLE CRYSTAL STAINLESS STEEL.
- Authors
NAKAE, T.; TAKAHASHI, R.; NOMURA, T.; NAKAI, Y.; KAGEYAMA, H.; SHIMATANI, N.; AWATA, T.; NISHIHATA, A.; ARAI, S.; KAWATSURA, K.; HORINO, Y.; MOKUNO, Y.; FUJII, K.; AOKI, Y.; TAKESHITA, H.; YAMAMOTO, S.; GOPPELT-LANGER, P.; NARAMOTO, H.; MITAMURA, T.; TERASAWA, M.
- Abstract
The characterization of the single crystal of type 304 stainless steels was performed by using particle induced x-ray emission and Rutherford backscattering spectroscopy with channeling technique (PIXE-C and RBS-C). They proved that the solution annealing process is absolutely necessary for production of a good single crystal of stainless steels. They are also shown that the positions of P atoms before He irradiation were mostly substitutional sites of fcc structure and that MeV He ion irradiation induced segregation of Si and S atoms to the (110) surface.
- Publication
International Journal of PIXE, 1994, Vol 4, Issue 2/3, p193
- ISSN
0129-0835
- Publication type
Article
- DOI
10.1142/S0129083594000234