Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleSub-picosecond 1030 nm laser-induced damage threshold evaluation of pulsed-laser deposited sesquioxide thin films.AuthorsStehlik, Marek; Govindassamy, Goby; Zideluns, Janis; Lemarchand, Fabien; Wagner, Frank; Lumeau, Julien; Mackenzie, Jacob; Gallais, LaurentPublicationOptical Engineering, 2022, Vol 61, Issue 7, p71603ISSN0091-3286Publication typeArticleDOI10.1117/1.OE.61.7.071603