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- Title
Lateral Inverse Proximity Effect in Ti/Au Transition Edge Sensors.
- Authors
Nagayoshi, K.; de Wit, M.; Taralli, E.; Visser, S.; Ridder, M. L.; Gottardi, L.; Akamatsu, H.; Vaccaro, D.; Bruijn, M. P.; Gao, J.-R.; den Herder, J. W. A.
- Abstract
We report measured T c of superconducting Ti/Au bilayer strips with a width W varying from 5 to 50 µm. The strips were fabricated based on a Ti/Au bilayer that consists of a 41-nm-thick Ti layer to which a 280-nm-thick Au layer was added. We find that the T c drops as W decreases and the declining trend almost perfectly follows T c / [ mK ] = - 738.4 [ μ m ] 2 / W 2 + 91.0 , where T c (W = ∞) of 91 mK is consistent with the intrinsic T c of the bilayer. The result is interpreted as a consequence of the lateral inverse proximity effect originated in normal-metal microstructures, namely Au overhangs that exist at the edges of the Ti/Au bilayer. The T c shift from the intrinsic T c should be anticipated in addition to the longitudinal proximity effect from superconducting Nb leads when one designs Ti/Au TESs.
- Subjects
DETECTORS; MICROSTRUCTURE; X-rays
- Publication
Journal of Low Temperature Physics, 2022, Vol 209, Issue 3/4, p540
- ISSN
0022-2291
- Publication type
Article
- DOI
10.1007/s10909-022-02828-3