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- Title
How Smart Manufacturing Can Help Combat the COVID-19 Pandemic.
- Authors
Lin, Yun-Siang; Cheng, Chao-Min; Chien, Chen-Fu
- Abstract
Virtual metrology (VM) technology that can adapt previous real process values to predict metrology values is viewed as the solution for metrology delay, since it can virtually predict the metrology value within a few seconds to provide the information to support real-time decision. Since microfluidic mRNA-based vaccine manufacturing contains only a single process step without measurement results from the previous step, the feedback R2R schema that returns metrology information may be employed as a solution. With multiple sensors installed on machines, massive engineering and manufacturing data can be automatically recorded to derive valuable information through big data analytics and artificial intelligence technologies to empower smart manufacturing.
- Subjects
COVID-19 pandemic; ARTIFICIAL intelligence; CYBER physical systems; VACCINE manufacturing; SEMICONDUCTOR manufacturing
- Publication
Diagnostics (2075-4418), 2021, Vol 11, Issue 5, p885
- ISSN
2075-4418
- Publication type
Editorial
- DOI
10.3390/diagnostics11050885